Communication devices and other electronic equipment use a variety of active devices including digital and analog ICs. Increased data clock rates and densely packed active components create an ideal environment for electromagnetic interference (EMI) as well as create ground bounce and Vcc droop. This interference contributes to jitter and timing problems within the integrated circuits and its impact on performance is difficult to model using simulations therefore it needs to be verified early in the design cycle. Noisecom JV9000 generates random noise (AWGN) and deterministic (CW) signals and injects them to the power supply (Vcc) in a controlled fashion to allow the user to test their device, circuit or system performance against noise on Vcc.
ASTERION Electronics > News > Noisecom > New Webinar – Noisecom JV9000: Test your device, circuit or system performance against noise on Vcc